Application notes

Electronic Component Inspection

Posted in Application notesAutofocusPureFocus 850

Nov 26th 2020

PureFocus850 Reduces Electronic Component Inspection Time by 95%

PureFocus850

Posted in Application notesAutofocusPureFocus 850

Jul 7th 2020

Rapid scanning of Silicon Carbide wafers using Prior Scientific’s PureFocus 850 Autofocus