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Prior Scientific

Experts in Precision Positioning and Microscope Automation

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Home » Imaging Components » Focus Mechanisms » WP120B Low Profile Tip and Tilt Stage for 300 mm Wafers
Piezo z-axis stage for semiconductor inspection with a 12-inch silicon wafer.

WP120B Low Profile Tip and Tilt Stage for 300 mm Wafers


Fast, Accurate Wafer Positionining For High-Throughput Applications

The WP120B is Queensgate’s most accurate wafer positioning stage.

It uses a parallel-kinematic tripod design to achieve sample leveling of ±50 µrad, while achieving milisecond step-and-settle times over the 120 µm closed-loop Z range.

Sub-nanometer-resolution capacitive displacement sensors directly measuring the moving platform, flexure guidance, and high-bandwidth closed-loop control provide exceptional flatness whilst scanning, with pitch and roll errors of less than 2 µrads.

The stage is designed to hold 300 mm wafers, with load capacity up to 8 kg, through-holes allow access for wafer lift-pin systems.

It is compatible with Prior’s ProScan H112 Large Format XY Stage, which offers a full 300 x 300 mm travel range for wafer inspection and defect detection.

Enquire
Data sheet
  • 120 µm travel in Z (±60 µm)
  • Tip / tilt range of ± 50 µrad
  • Load capacity up to 8 kg
  • Customer selectable presets optimized for specific load requirements
Material Aluminum

Contact us for accessories information.

WP120B-Wafer-Stage-EN-Datasheet.pdf

Download

Contact us for compatibility information.

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