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WP120B Low Profile Tip and Tilt Stage for 300 mm Wafers


Fast, Accurate Wafer Positionining For High-Throughput Applications

The WP120B is Queensgate’s most accurate wafer positioning stage.

It uses a parallel-kinematic tripod design to achieve sample leveling of ±50 µrad, while achieving milisecond step-and-settle times over the 120 µm closed-loop Z range.

Sub-nanometer-resolution capacitive displacement sensors directly measuring the moving platform, flexure guidance, and high-bandwidth closed-loop control provide exceptional flatness whilst scanning, with pitch and roll errors of less than 2 µrads.

The stage is designed to hold 300 mm wafers, with load capacity up to 8 kg, through-holes allow access for wafer lift-pin systems.

It is compatible with Prior’s ProScan H112 Large Format XY Stage, which offers a full 300 x 300 mm travel range for wafer inspection and defect detection.


    • 120 µm travel in Z (±60 µm)
    • Tip / tilt range of ± 50 µrad
    • Load capacity up to 8 kg
    • Customer selectable presets optimized for specific load requirements
Axes Z, Tip-Tilt
Open Loop Range (Z) 140 µm
Closed Loop Range (Z) 120 µm
Closed Loop Range (Tip Tilt) 100 µrad
Resonant Frequency at 0 kg 320 Hz
Resonant Frequency at 5.2 kg 190 Hz
Resonant Frequency at 8 kg 155 Hz
Linearity Error (Z) Min: 0.06%, Max: 0.15%
Linearity Error (Tip-Tilt) Min: 0.06%, Max: 0.15%
Roll Pitch Yaw 2 µrad (while commanding Z axis only)
Step Settle (1 µm) 9 ms
Repeatability, 60 µm step 5.5 nm
Material Aluminum
Stage mass (excluding cables) 5.8 kg
Size (L x W x H) 375 x 375 x 30 mm

Specifications as per datasheet. Please see datasheet for details.

Option Manufacturer Compatibility Notes

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